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Search for "frequency characterization" in Full Text gives 2 result(s) in Beilstein Journal of Nanotechnology.

Methods for rapid frequency-domain characterization of leakage currents in silicon nanowire-based field-effect transistors

  • Tomi Roinila,
  • Xiao Yu,
  • Jarmo Verho,
  • Tie Li,
  • Pasi Kallio,
  • Matti Vilkko,
  • Anran Gao and
  • Yuelin Wang

Beilstein J. Nanotechnol. 2014, 5, 964–972, doi:10.3762/bjnano.5.110

Graphical Abstract
  • methods is verified by experimental measurements from an n-type SiNW FET. Keywords: admittance spectroscopy; excitation design; frequency characterization; frequency response; silicon nanowire; Introduction Recent development in sensing biochemical molecules has been rapid. Among many sensing
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Published 04 Jul 2014

Wavelet cross-correlation and phase analysis of a free cantilever subjected to band excitation

  • Francesco Banfi and
  • Gabriele Ferrini

Beilstein J. Nanotechnol. 2012, 3, 294–300, doi:10.3762/bjnano.3.33

Graphical Abstract
  • /driving signal. With this approach the phase rotation is measured at each frequency that resides within the excited band around a cantilever resonance and it is possible to follow its time evolution. The advantage with respect to single-frequency techniques is a more robust all-frequency characterization
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Published 29 Mar 2012
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